Interface models for thin interfacial layers

There have already been several interface models for the analyses of thin interfacial layers in bonded materials. To distinguish their corresponding advantages or limitations, a comparative study is carried out, and a new constitutive-based interface model is proposed. Through numerical examinations, the limitations of typical models are clarified. It is found that the new interface model is an efficient and accurate model, by which both the traction and the displacement jumps across the modelled interface with the thickness of zero are allowed, and the stresses within the interfacial layer can also be analyzed.