首页 | 本学科首页   官方微博 | 高级检索  
     检索      

基于Laplace变换法的光电探测器频率响应研究
引用本文:卞剑涛,程翔,陈朝.基于Laplace变换法的光电探测器频率响应研究[J].光子学报,2007,36(10):1804-1807.
作者姓名:卞剑涛  程翔  陈朝
作者单位:1. 厦门大学,物理系,福建,厦门,361005
2. 厦门大学,机电工程系,福建,厦门,361005
基金项目:科技部中国-白俄罗斯科技合作项目(CB7-2-10),福建省重大专项前期研究项目(2005HZ1017)资助
摘    要:从光电探测器的基本方程出发,采用Laplace变换方法,分析了一种与CMOS标准工艺兼容的N-well/P-sub结构光电探测器的频率响应特性,780 nm和650 nm波长下的截止频率分别为14.4 MHz和43 MHz.该分析方法克服了频率特性测量中存在负载影响和采用渡越时间分析截止频率所存在的近似与作用不确定的问题,适用于各种PN以及PIN结构的光电探测器的频率特性研究.

关 键 词:光电子学  光电探测器  Laplace变换  频率响应  CMOS工艺
文章编号:1004-4213(2007)10-1804-4
收稿时间:2006-05-26
修稿时间:2006-05-26

The Frequency Response Research of Photodetector by Laplace Transform
BIAN Jian-tao,CHENG Xiang,CHEN Chao.The Frequency Response Research of Photodetector by Laplace Transform[J].Acta Photonica Sinica,2007,36(10):1804-1807.
Authors:BIAN Jian-tao  CHENG Xiang  CHEN Chao
Institution:a. Department of physics ;b. Department of Mechanical and Electrical Engineering, Xiamen University, Xiamen, Fujian 361005, China
Abstract:Depended on the basic equations of photodetector, the frequency response characteristic of a N-well/P-sub structure photodetector in standard CMOS technology is analyzed by the Laplace transform method.The intrinsic cut-off frequency of this photodetector is 14.4 MHz and 43 MHz in 780 nm and 650 nm wavelength,respectively.Usually,the photodetector bandwidth can only be approximately analyzed by transport time, whose reaction on the whole response time is uncertainty.Also the Laplace method avoids the influence of load circuits in frequency measurement.It is fit for the frequency response research of PN or PIN photodetector.
Keywords:Optoelectronics  Photodetector  Laplace transform  Frequency response  CMOS technology
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《光子学报》浏览原始摘要信息
点击此处可从《光子学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号