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High Spectral Resolution Mo/Si Multilayers Working at High Order Reflection
作者姓名:吴文娟  朱京涛  王占山  张众  王风丽  王洪昌  张淑敏  徐垚  程鑫彬  王蓓  李存霞  吴永荣  秦树基  陈玲燕  周洪军  霍同林
作者单位:[1]Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092 [2]National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029
基金项目:Supported by the National Natural Science Foundation of China under Grant Nos 60378021 and 10435050, the Hi-Tech Research and Development Programme of China, the Program for New Century Excellent Talents in University (NCET-04-0376), and the Research Fund of Tongji University.
摘    要:The high reflectance orders are used to improve the spectral resolution of Mo/Si multilayers. The multilayers for the first-, second- and third-order reflectance are designed and optimized, respectively. These multilayers are fabricated by using a directed current magnetron sputtering system, and the reflectivity is measured in an extreme ultraviolet range by synchrotron radiation. The experimental results show that the spectral resolution λ/Δλ(λ= 14 nm) increases from 24.6 for the first order to 66.6 for the third order.

关 键 词:高光谱分辨率  高阶反射  最优化  磁电管  紫外范围
收稿时间:2006-04-03
修稿时间:2006-04-03

High Spectral Resolution Mo/Si Multilayers Working at High Order Reflection
WU Wen-Juan, ZHU Jing-Tao, WANG Zhan-Shan, ZHANG Zhong, WANG Feng-Li, WANG Hong-Chang, ZHANG Shu-Min, XU Yao, CHENG Xin-Bin, WANG Bei, LI Cun-Xia, WV Yong-Rong, QIN Shu-Ji, CHEN Ling-Yan, ZHOU Hong-Jun, nvo Wong-Lin.High Spectral Resolution Mo/Si Multilayers Working at High Order Reflection[J].Chinese Physics Letters,2006,23(9):2534-2537.
Authors:WU Wen-Juan  ZHU Jing-Tao  WANG Zhan-Shan  ZHANG Zhong  WANG Feng-Li  WANG Hong-Chang  ZHANG Shu-Min  XU Yao  CHENG Xin-Bin  WANG Bei  LI Cun-Xia  WV Yong-Rong  QIN Shu-Ji  CHEN Ling-Yan  ZHOU Hong-Jun  nvo Wong-Lin
Institution:1.Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092 ; 2.National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029
Abstract:
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