Diffusion of Ag through Se and its effect on interferometric thickness measurement |
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Authors: | S Mokhtar S Abdel-Aziz |
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Institution: | (1) National Institute of Standards, Cairo, Egypt |
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Abstract: | The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has
been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse
through Se. The thickness was measured by multiple beam fringes at reflection. |
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Keywords: | Selenium films diffusion of silver interference fringes |
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