Bi3.15Eu0.85Ti3O12铁电薄膜的结构与光学性能

采用化学溶液沉积法在石英衬底上制备了Bi_3.15Eu_0.85Ti₃O₁₂ (BEuT) 铁电薄膜,研究了 BEuT薄膜的结构和光学性能。XRD结果表明,不同温度退火的BEuT皆形成铋层状钙钛矿型结构,其晶粒尺寸随着退火温度的升高而增大,与SEM观察结果一致。对BEuT薄膜的拉曼光谱研究表明,Eu³⁺主要取代钙钛矿层中的Bi³⁺位。光学透过率曲线显示,在大于500 nm的波段,各BEuT薄膜的透过率均比较高,其禁带宽度约为 3.69 eV。BEuT薄膜的发光随着退火温度的升高而增强,这可归因于其结晶状况的改善。

Structural and Optical Properties of Bi3.15Eu0.85Ti3O12 Ferroelectric Thin Films

Bi3.15Eu0.85Ti3O12(BEuT) thin films were prepared on fused silica substrates by using chemical solution deposition technique.The structural and optical properties of thin films were stu-died in this work.XRD results show that BEuT thin films exhibit a polycrystalline bismuth-layered perovskite structure,and the average grain sizes increase with the annealing temperatures,which is consistent with the SEM results.Raman spectra of BEuT samples indicate that Eu3+ mainly replace Bi3+ in perovskete layer.In the wavelength of above 500 nm,BEuT thin films exhibit high optical transmittance,and the band gaps of all samples are nearly about 3.69 eV.The emission intensities of BEuT thin films increase with the annealing temperatures,which could be due to the improvement of crystallization for the samples annealed at higher temperature.