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Measuring static yield stress of electrorheological fluids using the slotted plate device
Authors:Young Dae Kim  Daniel De Kee
Affiliation:(1) Department of Chemical and Biomolecular Engineering and Tulane Institute for Macromolecular Engineering and Science (TIMES), Tulane University, New Orleans, LA 70118, USA;(2) Faculty of Applied Chemistry, Chonnam National University, Kwangju, 500-757, South Korea
Abstract:An electrorheological (ER) response is defined as the dramatic change in rheological properties of a suspension of small particles due to the application of a large electric field transverse to the direction of flow. ER fluids are typically composed of nonconducting or semiconducting particles dispersed in a nonconducting continuous phase. A sufficiently large electric field will cause ER fluids to solidify, giving rising to a yield stress. Many applications in torque and stress transfer devices were proposed employing the reversible yielding behavior of ER fluids. Successful applications depend on a large yield stress of ER fluids and therefore accurate measurements of the yield stress of ER fluids are required. Reported experimental yield stresses of ER fluids have been dynamic yield stresses obtained by extrapolating the shear stress–shear rate data to zero-shear rate. It would be very helpful to the understanding of ER behaviors and the applications of ER fluids to be able to measure the static yield stress of ER fluids accurately. The slotted plate technique has been shown to be a successful method to determine the static yield stress of suspensions. The values obtained via the slotted plate method are static yield stress as the platform is designed for extremely low-speed motion. In this study, we modified the slotted plate device for the application of large electric fields and measured the static yield stress of TiO2 ER fluids under various electric fields. The measured static yield stress values are also compared with the static yield stress values from a commercial rheometer.
Keywords:Slotted plate device  Yield stress  Electrorheology  Suspension
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