Study of titania nanorod films deposited by matrix-assisted pulsed laser evaporation as a function of laser fluence |
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Authors: | A P Caricato M R Belviso M Catalano M Cesaria P D Cozzoli A Luches M G Manera M Martino R Rella A Taurino |
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Institution: | 1.Department of Solid State Engineering,Institute of Chemical Technology,Prague,Czech Republic;2.New Technologies-Research Centre in Westbohemian Region,University of West Bohemia,Plzen,Czech Republic;3.Department of Applied Physics and Mathematics,University of Pardubice,Pardubice,Czech Republic;4.Anton Paar GmbH,Graz,Austria;5.Department of Chemistry,J.E. Purkyně University,Usti nad Labem,Czech Republic |
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Abstract: | The effects of annealing at 300 °C on gold nanostructures sputtered onto glass substrate were studied using XRD, SAXSees,
the Van der Pauw method and ellipsometry. As-sputtered and annealed samples exhibit a different dependence of the gold lattice
parameter on the sputtering time. With increasing sputtering time the average thickness of the layer and the size of gold
crystallites increased. Another rapid enlargement of the crystallites is observed after annealing. The volume resistivity
decreases rapidly with the increasing sputtering time for both, as-deposited and annealed structures. With increasing sputtering
time initially discontinuous gold coverage changes gradually in a continuous one. Electrically continuous gold coverage on
the as-sputtered and annealed samples exhibits the same concentration of free charge carriers and Hall mobility. Optical constants
of as-deposited and annealed gold films determined by ellipsometry support resistivity measurements and clearly manifest the
presence of plasmons in discontinuous films. |
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