Use of surface plasmon excitation for determination of the thickness and optical constants of very thin surface layers

We present a method using attenuated total reflection (ATR) with excitation of surface plasma waves at different wavelengths and angles of incidence, which allows an accurate determination of the thickness and optical constants of absorbing surface layers from optical measurements only. This method is applied to the case of very thin Au surface layers on (111)Ag, and the results are discussed.