Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens |
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Authors: | V G Kohn I A Smirnova I I Snigireva A A Snigirev |
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Institution: | 1.National Research Centre “Kurchatov Institute,”,Moscow,Russia;2.Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”,Russian Academy of Sciences,Moscow,Russia;3.Institute of Solid State Physics,Russian Academy of Sciences,Chernogolovka, Moscow oblast,Russia;4.European Synchrotron Radiation Facility,Grenoble,France;5.I. Kant Baltic Federal University,Kaliningrad,Russia |
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Abstract: | The results of the first experimental realization of a spectrometer based on the effect of diffraction focusing of X rays by a flat single crystal are discussed. A secondary X-ray source with a relatively high angular divergence and small sizes was formed at the focus of a compound refractive lens having 50 beryllium biconcave elements with a curvature radius of 50 μm. The silicon spectrometer crystal was cut in the form of a wedge of variable thickness, oriented perpendicular to the diffraction plane. The reflection 111 was used for energies of 8.3 and 12 keV. To simulate the experiment, a computer program was developed, which takes into account accurately and for the first time the focusing of radiation by the lens and its subsequent diffraction in the crystal. A calculated curve for a monochromatic beam has made it possible to determine the monochromator spectrum with high resolution from experimental data for a polychromatic beam. It is shown that monochromator resolution increases with an increase in the distance from the compound refractive lens to the crystal. |
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