Activation analysis for selenium and tellurium trace impurities in gallium, arsenic and gallium arsenide |
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Authors: | Rausch H Salamon A |
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Affiliation: | Research Institute for Telecommunication Hungarian Academy of Sciences, BudapestHungary. |
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Abstract: | Destructive and non-destructive activation analysis for selenium and tellurium has been studied. In destructive analysis the selenium and tellurium activities are co-extracted from the irradiated and dissolved matrix elements with dithizone/CCl(4), reagent in a hot-chamber by remote manipulation, then separated from each other by diethylammonium-N,N-diethyldithiocarbamate/CCl(4) extraction, tellurium going into the organic phase and selenium being retained by the aqueous phase. The sensitivity of the method is 10(-8)g for both elements. By non-destructive methods, selenium can be determined down to 10(-6)g on short irradiation, and down to 3 x 10(-8) g on long irradiation and cooling, and tellurium down to 10(-6) g with long irradiation and cooling. |
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