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硅酸镥闪烁晶体的生长与缺陷研究
引用本文:秦来顺,陆晟,李焕英,史宏声,任国浩. 硅酸镥闪烁晶体的生长与缺陷研究[J]. 人工晶体学报, 2004, 33(6): 999-1003
作者姓名:秦来顺  陆晟  李焕英  史宏声  任国浩
作者单位:中国科学院上海硅酸盐研究所,上海,200050;中国科学院上海硅酸盐研究所,上海,200050;中国科学院上海硅酸盐研究所,上海,200050;中国科学院上海硅酸盐研究所,上海,200050;中国科学院上海硅酸盐研究所,上海,200050
摘    要:本文采用提拉法生长出了硅酸镥闪烁晶体,讨论了晶体生长中遇到的问题,所生长的硅酸镥晶体有开裂、解理、多晶、回熔现象等宏观生长缺陷和包裹物、位错等微观缺陷.开裂是由热应力和晶体解理两种因素引起的,其中热应力是导致开裂的主要因素,优化生长工艺条件可完全避免开裂.晶体中存在两种包裹物,成份分别为氧化镥和坩埚材料铱,氧化镥很可能是未参加反应的原料,也有可能是氧化硅挥发而导致氧化镥析出.

关 键 词:硅酸镥  闪烁晶体  晶体生长  缺陷
文章编号:1000-985X(2004)06-0999-05

Growth and Study on Defects of LSO:Ce Scintillation Crystal
QIN Lai-shun,LU Sheng,LI Huan ying,SHI Hong-sheng,REN Guo-hao. Growth and Study on Defects of LSO:Ce Scintillation Crystal[J]. Journal of Synthetic Crystals, 2004, 33(6): 999-1003
Authors:QIN Lai-shun  LU Sheng  LI Huan ying  SHI Hong-sheng  REN Guo-hao
Abstract:In this paper Lu_2SiO_5:Ce(LSO) scintillation crystal grown by Czochralski method is reported and growing difficulties are discussed.Then macro-defects including crack,cleavage, polycrystal and remelting and micro-defects including inclusions and dislocation in LSO crystal were found, and the origin of defects was simply analyzed. The cracking of crystal is caused by both thermal stress and cleavage.The thermal stress is considered to be the main factor. By setting the preferred growth condition, LSO crystal free from cracks was successfully grown. There were two types of inclusions, whose components are respectively Lu_2O_3 and Ir.The inclusions of Ir come from the crucible and inclusions of Lu_2O_3 maybe come from the raw material Lu_2O_3 not reacting. It also probably resulted from SiO_2.
Keywords:LSO:Ce  scintillator  crystal growth  defects
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