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Surface molecular characterisation of different epoxy resin composites subjected to UV accelerated degradation using XPS and ToF-SIMS
Authors:Firas Awaja  Paul J Pigram
Institution:a Centre for Material and Fibre Innovation, Geelong Technology Precinct, Deakin University, Geelong, Victoria 3217, Australia
b Centre for Materials and Surface Science, La Trobe University, Victoria 3086, Australia
c Department of Physics, La Trobe University, Victoria 3086, Australia
Abstract:Epoxy resin composites reinforced with E-glass (E), 3D glass (3D) and carbon fibre (CF) were subjected to an intense UV and high temperature accelerated degradation environment. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to provide a molecular characterisation of the surface of the degraded composites. The response at the surface of the epoxy resin composites to oxidative degradation is influenced by the composite reinforcement type and characteristics. XPS results indicate that 3D resin composites exhibit more surface oxidation as a result of the accelerated degradation in comparison with E and CF composites. Principal components analysis (PCA) of the ToF-SIMS positive ion spectra showed that E and 3D resin composites suffered chain scission while CF composites suffered chain scission and cross-linking reactions as a result of the intense UV exposure. The extent of the surface oxidation, cross-linking/condensation reaction and loss of low molecular weight (lower than C4Hx) aliphatic hydrocarbons may be indicated using PCA of both the ToF-SIMS positive and negative ion spectra. PCA also provides insight for proposing epoxy resin chain scission and oxidation reaction mechanisms.
Keywords:ToF-SIMS  XPS  Accelerated degradation  Epoxy resin  UV
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