Effect of grain boundaries on paraconductivity of YBa2Cu3Ox

To investigate the effect of grain boundaries on paraconductivity of YBa₂Cu₃O_x, melt-textured and c-axis oriented thin films with controlled grain boundaries (superconducting transition width, ΔT, varying between 0.54 and 2.85 K) were prepared, and dc-conductivity has been measured as a function of temperature. In the logarithmic plots of excess-conductivity (Δσ) and reduced temperature (?), starting from low values of ?, we have observed three different regions namely critical region, mean field region and short wave fluctuation region. A correlation is observed between the range of critical region and ΔT, which is found to increase with ΔT. While for ΔT values smaller than 2.5 K only static critical region is observed, for higher ΔTs both static and dynamic critical regions are observed. In the mean field region a crossover from 3D to 2D was observed for all the samples. At ? values larger than 0.24, the excess-conductivity decreased sharply as ?⁻³, which suggested the existence of the short wave fluctuations.