Correction of self-absorption spectral line and ratios of transition probabilities for homogeneous and LTE plasma |
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Authors: | Hssaine Amamou Andre BoisBelkacem Ferhat Roland RedonBruno Rossetto Pascal Matheron |
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Institution: | a Laboratoire d'Optique Appliquée (LOA), Université de Toulon et du Var, BP 132, 83957 La Garde, Cedex, France b Institut de Physique USTHB, BP No. 32 El-Alia-Dar El Beida-Alger, Algeria |
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Abstract: | Expressions for fundamental spectral line parameters are reported for Gaussian and Lorentzian shape profiles for homogeneous plasma at equilibrium in presence of the self-absorption. These expressions for Lorentzian profiles are applied to the determination of the ratios of transition probabilities and the ratios of optical thicknesses by a new method that we propose in this article. The self-absorption is computed by spectral line profiles with a Simplex algorithm program fitting. Applications to some experimental lines illustrate the appropriate corrections. |
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Keywords: | Plasma laser spectroscopy Self-absorption Optical thickness Transition probabilities Silicon multiple lines Doppler effect Stark effect |
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