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Correction of self-absorption spectral line and ratios of transition probabilities for homogeneous and LTE plasma
Authors:Hssaine Amamou  Andre BoisBelkacem Ferhat  Roland RedonBruno Rossetto  Pascal Matheron
Institution:a Laboratoire d'Optique Appliquée (LOA), Université de Toulon et du Var, BP 132, 83957 La Garde, Cedex, France
b Institut de Physique USTHB, BP No. 32 El-Alia-Dar El Beida-Alger, Algeria
Abstract:Expressions for fundamental spectral line parameters are reported for Gaussian and Lorentzian shape profiles for homogeneous plasma at equilibrium in presence of the self-absorption. These expressions for Lorentzian profiles are applied to the determination of the ratios of transition probabilities and the ratios of optical thicknesses by a new method that we propose in this article. The self-absorption is computed by spectral line profiles with a Simplex algorithm program fitting. Applications to some experimental lines illustrate the appropriate corrections.
Keywords:Plasma laser spectroscopy  Self-absorption  Optical thickness  Transition probabilities  Silicon multiple lines  Doppler effect  Stark effect
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