Surfactant adsorbed layer structure at solid/solution interfaces: impact and implications of AFM imaging studies |
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| Affiliation: | 1. School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai 200237, China;2. Department of Chemistry, Lanzhou University, Lanzhou, Gansu 730000, China;1. Key laboratory of Colloid and Interface Chemistry, Shandong University, Ministry of Education, Jinan 250100, PR China;2. Key Laboratory of Coal Science and Technology of Ministry of Education and Shanxi Province, Taiyuan University of Technology, Taiyuan 030024, China;1. Institut National de la Recherche Scientifique Énergie, Matériaux et Télécommunications (INRS - EMT) 1650, Boul. Lionel-Boulet, Varennes, Québec, J3X 1S2, Canada |
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| Abstract: | Recent advances in determination and understanding of surfactant adsorbed layer structure at the solid/solution interface are reviewed, with particular attention to atomic force microscopy imaging. The emerging picture of the surfactant adsorbed layer on solid substrates as consisting of micelle-like aggregates is described, and some unresolved issues and possible future line of inquiry discussed. |
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