Synchrotron radiation for structure analysis—EXAFS and XANES |
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Authors: | Takatoshi Murata |
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Affiliation: | (1) Department of Physics, Kyoto University of Education, Fukakusa, Fushimi-ku, 612 Kyoto, Japan |
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Abstract: | In this paper, a newly developed technique for the structure analysis of materials by the use of the X-rays emitted from storage ring of synchrotron is introduced. Principle, applications and limitations of the extended X-ray absorption fine structure (EXAFS) and X-ray absorption near edge structure (XANES) are discussed. |
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Keywords: | EXAFS XANES structure analysis |
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