PtSi/p-Si肖特基势垒红外探测器的研制 |
| |
引用本文: | 李国正,李道全.PtSi/p-Si肖特基势垒红外探测器的研制[J].固体电子学研究与进展,1994,14(4):342-346. |
| |
作者姓名: | 李国正 李道全 |
| |
摘 要: | 介绍了PtSi/p-Si肖特基势垒红外探测器(简称IR-SBD)的优化结构及探测机理,给出了探测器的光增益模型,并对器件进行了制作及性能测试。器件在77K下,反偏4V时的反向漏电流为5×10(-6)μA,对1.52μm红外光的灵敏度为2.69×10(-2)A/W,量子效率为2.4%。
|
关 键 词: | PtSi,红外光,肖特基势垒探测器 |
Study and Manufacture of PtSi/p-Si Infrared Schottky Barrier Detector |
| |
Abstract: | Detecting principle and optimized structure of PtSi/p-Si infrared Schottky barrier detector(IR-SBD) are described in this paper. Photoyield model of the detector is given. The manufacture and characteristic test of the IR-SBD are also successfully carried out. Under the temperature of 77 K, the reverse leakage current of the IR-SBD is 5× 10(-6) μA at reverse bias voltage of 4 V. The responsibility is 2. 69×10(-2) A/W and quantum efficiency is 2. 4% for the infrared light wavelength of 1. 52μm. |
| |
Keywords: | PtSi Infrared Light Schottky Barrier Detector |
本文献已被 维普 等数据库收录! |