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PtSi/p-Si肖特基势垒红外探测器的研制
引用本文:李国正,李道全.PtSi/p-Si肖特基势垒红外探测器的研制[J].固体电子学研究与进展,1994,14(4):342-346.
作者姓名:李国正  李道全
摘    要:介绍了PtSi/p-Si肖特基势垒红外探测器(简称IR-SBD)的优化结构及探测机理,给出了探测器的光增益模型,并对器件进行了制作及性能测试。器件在77K下,反偏4V时的反向漏电流为5×10(-6)μA,对1.52μm红外光的灵敏度为2.69×10(-2)A/W,量子效率为2.4%。

关 键 词:PtSi,红外光,肖特基势垒探测器

Study and Manufacture of PtSi/p-Si Infrared Schottky Barrier Detector
Abstract:Detecting principle and optimized structure of PtSi/p-Si infrared Schottky barrier detector(IR-SBD) are described in this paper. Photoyield model of the detector is given. The manufacture and characteristic test of the IR-SBD are also successfully carried out. Under the temperature of 77 K, the reverse leakage current of the IR-SBD is 5× 10(-6) μA at reverse bias voltage of 4 V. The responsibility is 2. 69×10(-2) A/W and quantum efficiency is 2. 4% for the infrared light wavelength of 1. 52μm.
Keywords:PtSi  Infrared Light  Schottky Barrier Detector
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