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Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates |
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| Authors: | Van Ham Rita Van Vaeck Luc Adriaens Annemie Adams Freddy Hodges Brittany Gianotto Anita Avci Recep Appelhans Anthony Groenewold Gary |
| Institution: | a Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium b Department of Analytical Chemistry, Ghent University, Krijgslaan 281 - S12, B-9000 Ghent, Belgium c Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, IN 47907-2084, USA d Chemistry Department, Idaho National Engineering and Environmental Laboratory, Idaho Falls, ID 83415-2208, USA e Instrument and Chemical Analysis Laboratory, Department of Physics, Montana State University, Bozeman, MT 59717, USA |
| Abstract: | The feasibility of static secondary ion mass spectrometry (S-SIMS) for the detection of molecule specific information from complex materials, such as natural clay and soil samples, has been investigated. Ion trap (IT), as well as triple quadrupole (TQ) instruments, have been used for mass analysis. Secondary ion images have been acquired using time-of-flight (TOF) S-SIMS. The generation of molecular adduct ions from thin and thick layers on the mineral substrates has been investigated using KBr as a simple model system. Results show that molecular adducts of KBr can be indeed detected from the spiked materials. However, the concentrations of the spiking solutions have to be significantly larger than expected from the surface area measured by gas adsorption techniques. In addition imaging analysis has evidenced that the detection of adduct ions in the mass spectra directly relates to the presence of local micro-crystallites. |
| Keywords: | Static SIMS Polyatomic ions Speciation Clay Binary salts |
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