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Using photoelectron emission microscopy with hard-X-rays |
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| Authors: | Y Hwu W L Tsai B Lai J H Je G H Fecher M Bertolo G Margaritondo |
| Institution: | a Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, ROC b Institut de Physique Appliquée, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland c Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA d Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea e Institut für Physik, Johannes Gutenberg-Universität, Mainz, Germany f Sincrotrone Trieste SCpA, Trieste, Italy |
| Abstract: | We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 μm2 for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray. This approach again leads to the unprecedented 0.3 μm lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. |
| Keywords: | Photoelectron emission X-ray absorption spectroscopy |
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