Transmission eigenvalues with artificial background for explicit material index identification |
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Authors: | Lorenzo Audibert Lucas Chesnel Houssem Haddar |
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Institution: | 1. Department STEP, EDF R&D, 6, quai Watier, 78401 Chatou cedex, France;2. INRIA/Centre de mathématiques appliquées, École polytechnique, Université Paris-Saclay, route de Saclay, 91128 Palaiseau, France |
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Abstract: | We are interested in the problem of retrieving information on the refractive index n of a penetrable inclusion embedded in a reference medium from farfield data associated with incident plane waves. Our approach relies on the use of transmission eigenvalues (TEs) that carry information on n and that can be determined from the knowledge of the farfield operator F. In this note, we explain how to modify F into a farfield operator , where is computed numerically, corresponding to well-chosen artificial background and for which the associated TEs provide more accessible information on n. |
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