Instability of an elastic film on a viscous layer |
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Authors: | N. Mokni M. Kostrzewa F. Sidoroff |
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Affiliation: | aLGM – Ecole Nationale d'Ingénieurs de Monastir, Tunisie;bLTDS – Ecole Centrale de Lyon, France;cLEOM – Ecole Centrale de Lyon, France |
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Abstract: | A flat, compressed elastic film on a viscous layer is unstable. The film can form wrinkles to reduce the elastic energy. In this paper, we are interested in the two-dimensional models for thin films bonded to a viscous layer and in particular we focus on generic instabilities evidenced in this context by Suo and coworkers [Huang, Z., Hong, W., Suo, Z., 2005. Non linear analyses of wrinkles in a film bonded to a compliant substrate. J. Mech. Phys. Solids 53, 2101–2118; Lo, Y.H., 1991. New approach to grow pseudomorphic structures over the critical thickness. Appl. Phys. Lett. 59, 2311–2320]. We present a rigorous linear perturbation analysis for anisotropic materials, that allows the prediction of both the orientation of the corrugations of the thin film, and the wavelength that maximize the growth velocity. Finally, we compare our theoretical estimates to experimental results for a In0.65Ga0.35As alloy constraint to InP. |
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Keywords: | Thin films Epitaxy Stress relaxation Viscoelasticity |
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