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发光隧道结表面粗糙度的隧道显微镜研究
引用本文:江孟蜀 舒启清. 发光隧道结表面粗糙度的隧道显微镜研究[J]. 光学学报, 1992, 12(1): 8-82
作者姓名:江孟蜀 舒启清
作者单位:渝州大学物理系 重庆630033(江孟蜀),重庆大学应用物理系 重庆630044(舒启清)
基金项目:国家自然科学基金会的资助
摘    要:本文报道用扫描隧道显微镜(STM)在空气中观测淀积在100nm厚的CaF_2薄膜上的Al-Al_2O_3-Au发光隧道结表面的研究成果.在观测中首次发现结表面呈现出横向相关长度分别为30~70nm和3~5nm的两种粗糙度;横向相关长度小的粗糙度被横向相关长度大的所调制.这种横向相关长度为3~5nm的表面粗糙度的存在与Laks和Mills预期的表面随机粗糙隧道结发光理论值一致.

关 键 词:发光 隧道结 表面粗糙度 SPP STM
收稿时间:1990-06-25

Surface roughness study of light-emitting tunnel junction with scanning tunnelling microscope
JIANG MENGSHU. Surface roughness study of light-emitting tunnel junction with scanning tunnelling microscope[J]. Acta Optica Sinica, 1992, 12(1): 8-82
Authors:JIANG MENGSHU
Abstract:We report a study of the surface of Al-Al2O3-Au light-emitting junctions deposited on CaF2 underlayers of 100 nm thickness with scanning tunnelling micos-copy (STM) in air. For the first time, two kinds of the noughness on the junction surface are obserned, which have the transverse correlation length of 30-70nm and 3-5nm, respectively. The smaller one is modulated by the larger one. The existanoe of this surface roughness with the transverse correlation length of 3-5 nm is in agreement with the theoretical predication of Lake and Mills[2],
Keywords:Light-emitting tunnel junction   surface plasmon-polarition   surface noughness.  
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