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用近贴式软X射线光刻术研究DCPA光刻胶的曝光性能
引用本文:郭玉彬,慎微.用近贴式软X射线光刻术研究DCPA光刻胶的曝光性能[J].光子学报,1995,24(3):249-257.
作者姓名:郭玉彬  慎微
作者单位:中国科学院长春光学精密机械研究所,应用光学国家重点实验室,化工部无锡化工研究设计院
摘    要:采用软X射线近贴式光刻术,对DCPA光刻胶的曝光性能进行了系统研究,得到了一些新的实验结果。

关 键 词:软X射线  近贴式  光刻胶  光刻术
收稿时间:1994-03-28

INVESTIGATION ON EXPOSURE CHARACTERISTICS 0F SOFT-X-RAY RESIST DCPA USING SOFT X-RAY CONTACT LITHOGRAPHY
Guo Yubin,Li Futian,Tang Jiuhua,Li Jia State Key Lab.of Applied Optics,Changchun Institute of Optics and Fine Mechanics,Academia Sinica,Changchun Shen Wei,Du Yongxing Ministry of Chemical Industry,Wuxi Institute of Chemical Engineering,Wuxi.INVESTIGATION ON EXPOSURE CHARACTERISTICS 0F SOFT-X-RAY RESIST DCPA USING SOFT X-RAY CONTACT LITHOGRAPHY[J].Acta Photonica Sinica,1995,24(3):249-257.
Authors:Guo Yubin  Li Futian  Tang Jiuhua  Li Jia State Key Labof Applied Optics  Changchun Institute of Optics and Fine Mechanics  Academia Sinica  Changchun Shen Wei  Du Yongxing Ministry of Chemical Industry  Wuxi Institute of Chemical Engineering  Wuxi
Institution:Guo Yubin,Li Futian,Tang Jiuhua,Li Jia State Key Lab.of Applied Optics,Changchun Institute of Optics and Fine Mechanics,Academia Sinica,Changchun 130022 Shen Wei,Du Yongxing Ministry of Chemical Industry,Wuxi Institute of Chemical Engineering,Wuxi 214031
Abstract:The exposure characteristics of soft X-ray resist DCPA were investigated using soft X-raycontact lithography. Some new results are obtined.
Keywords:Soft X-ray  Contact  Resist  Lithography
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