Quantitative imaging of electrospun fibers by PeakForce Quantitative NanoMechanics atomic force microscopy using etched scanning probes |
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Institution: | 1. Warsaw University of Technology, Faculty of Material Science and Engineering, 141 Woloska str., 02-507, Warsaw, Poland;2. Warsaw University of Technology, University Research Centre – Functional Materials, 141 Woloska str., 02-507, Warsaw, Poland;1. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan;2. Faculty of Materials Science and Engineering, Warsaw University of Technology (WUT), 141 Woloska Street, Warsaw 02-507, Poland;1. College of Engineering and Informatics, National University of Ireland Galway, Ireland;2. Nanoscale Function Group, Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Ireland;1. Centre National de la Recherche Scientifique UMR5672, Laboratoire de Physique, Ecole Normale Supérieure de Lyon, Université de Lyon I, France;2. Centre National de la Recherche Scientifique UMR5667, Laboratoire de Reproduction et de Développement des Plantes, Ecole Normale Supérieure de Lyon, Université de Lyon I, France;1. Warsaw University of Technology, Faculty of Materials Science and Engineering, Woloska 141, 02-507, Warsaw, Poland;2. Research Center for Functional Materials National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan;3. Warsaw University, Faculty of Chemistry, Department of Physical Chemistry, 02-093, Warsaw, Poland |
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Abstract: | Electrospun polymeric submicron and nanofibers can be used as tissue engineering scaffolds in regenerative medicine. In physiological conditions fibers are subjected to stresses and strains from the surrounding biological environment. Such stresses can cause permanent deformation or even failure to their structure. Therefore, there is a growing necessity to characterize their mechanical properties, especially at the nanoscale.Atomic force microscopy is a powerful tool for the visualization and probing of selected mechanical properties of materials in biomedical sciences. Image resolution of atomic force microscopy techniques depends on the equipment quality and shape of the scanning probe. The probe radius and aspect ratio has huge impact on the quality of measurement.In the presented work the nanomechanical properties of four different polymer based electrospun fibers were tested using PeakForce Quantitative NanoMechanics atomic force microscopy, with standard and modified scanning probes. Standard, commercially available probes have been modified by etching using focused ion beam (FIB). Results have shown that modified probes can be used for mechanical properties mapping of biomaterial in the nanoscale, and generate nanomechanical information where conventional tips fail. |
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Keywords: | Atomic force microscopy PeakForce Quantitative NanoMechanics Electrospun fibers Focused ion beam Mechanical properties |
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