1/f Noise QWIPs and nBn detectors |
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| Affiliation: | 1. Thales Research and Technology, 1 Avenue Augustin Fresnel, 91767 Palaiseau, France;2. ONERA, Chemin de la Hunière, 91761 Palaiseau, France;3. Univ. Montpellier, IES, UMR 5214, F-34000 Montpellier, France;4. CNRS, IES, UMR 5214, F-34000 Montpellier, France;1. Earth Observation Research Center (EORC), Japan Aerospace Exploration Agency, 2-1-1 Sengen, Tsukuba, Ibaraki 305-0035, Japan;2. College of Science and Engineering, Ritsumeikan University, 1-1-1, Noji-higashi, Kusatsu, Shiga 525-8577, Japan;3. Transmission Devices R&D Laboratories, Sumitomo Electric Industries, Ltd., 1, Taya-cho, Sakae-ku, Yokohama, Kanagawa 244-8588, Japan;1. School of Physics and Astronomy, Cardiff University, The Parade, Cardiff CF243AA, UK;2. California NanoSystem Institute, University of California, Los Angeles, CA 90095, USA |
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| Abstract: | The low-frequency noise is a ubiquitous phenomenon and the spectral power density of this fluctuation process is inversely proportional to the frequency of the signal. We have measured the 1/f noise of a 640 × 512 pixel quantum well infrared photodetector (QWIP) focal plane array (FPA) with 6.2 μm peak wavelength. Our experimental observations show that this QWIP FPA’s 1/f noise corner frequency is about 0.1 mHz. With this kind of low frequency stability, QWIPs could unveil a new class of infrared applications that have never been imagined before. Furthermore, we present the results from a similar 1/f noise measurement of bulk InAsSb absorber (lattice matched to GaSb substrate) nBn detector array with 4.0 μm cutoff wavelength. |
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| Keywords: | Infrared detector QWIP nBn Focal plane array 1/f Noise |
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