| 基于单片机的Flash存储器坏块自动检测 |
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| 引用本文： | 王新舜,张存善,韩力英,杨振华. 基于单片机的Flash存储器坏块自动检测[J]. 国外电子元器件, 2010, 0(3): 124-125,128 |
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| 作者姓名： | 王新舜 张存善 韩力英 杨振华 |
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| 作者单位： | 河北工业大学信息工程学院; |
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| 摘 要： | 在深入了解Flash存储器的基础上，采用单片机自动检测存储器无效块。主要通过读取每一块的第l、第2页内容，判断该块的好坏，并给出具体的实现过程，以及部分关键的电路原理图和C语言程序代码。该设计最终实现单片机自动检测Flash坏块的功能，并通过读取ID号检测Flash的性能，同时该设计能够存储和读取lGB数据。
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| 关 键 词： | NAND Hash ID号 AT89C51单片机 数码管 |
Auto detection invalid block of Flash memory based on SCM |
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| WANG Xin-shun,ZHANG Cun-shan,HAN Li-ying,YANG Zhen-hua. Auto detection invalid block of Flash memory based on SCM[J]. International Electronic Elements, 2010, 0(3): 124-125,128 |
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| Authors: | WANG Xin-shun ZHANG Cun-shan HAN Li-ying YANG Zhen-hua |
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| Affiliation: | School of Information Engineering;Hebei University of Technology;Tianjin 300130;China |
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| Abstract: | On the basis of in-depth understanding the Flash chips,this paper designs a new program which using the SCM to detect the invalid block.Mainly through reading the data of the first and second page to detect the invalid block.Specific implementation procedure was given,and the key circuit schematic diagram and C language program code was introduced.This design achieved the function of using the MCU checks the invalid block finally,and increased the function by reading the ID number of Flash to get the perfor... |
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| Keywords: | NAND Flash memory ID code AT89C51 digital tube |
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