Comprehensive kinetic model for electron-beam-excited XeCs+ ionic excimers |
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Authors: | J. L. Lawless D. Lo |
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Affiliation: | (1) Redwood Scientific, Inc., 1005 Terra Nova Blvd., 94044 Pacifica, CA, USA;(2) Physics Department, Chinese University of Hong Kong, Shatin, New Territories, Hong Kong |
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Abstract: | A theoretical model that accounts for fundamental plasma processes leading to the formation and decay of XeCs+ ionic excimers in high-pressure electron-beam-excited Ar/Xe/Cs mixtures was developed. Numerical calculations based on the model were performed. For atmospheric gas mixtures, the model predicts an intrinsic efficiency (energy stored in upper state/energy deposited) of 18%. Model calculations also indicate that while XeCs+ was predominantly formed via the rare-gas ion (Xe+) channel over the entire e-beam duration, the rare-gas metastable (Xe*) channel assumes dominance in the afterglow period. |
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Keywords: | 34.80 42.55Gp 52.65 |
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