| X荧光光谱分析软件的开发与应用 |
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| 引用本文： | 蔡鲲. X荧光光谱分析软件的开发与应用[J]. 光谱学与光谱分析, 2001, 21(5): 673-675 |
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| 作者姓名： | 蔡鲲 |
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| 作者单位： | 铁道部戚墅堰机车车辆工艺研究所, |
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| 摘 要： | 本文介绍了在能量色散X荧光分析仪上开发的文件资料管理系统，多元线性回归、快速半定量分析、镀层厚度分析和多功能Lucas-tooth强度校正等应用软件。这些软件的应用提高了分析水平、管理效率和科研开发能力。
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| 关 键 词： | 能量色散 X荧光光谱分析 多元线性回归 Lucas－tooth强度校正 镀层 厚度分析 分析软件 软件开发 应用 |
| 文章编号： | 1000-0593(2001)05-0673-03 |
| 修稿时间： | 1999-10-19 |
Development and Application of Software in EDXRF Spectrometer |
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| K Cai. Development and Application of Software in EDXRF Spectrometer[J]. Spectroscopy and Spectral Analysis, 2001, 21(5): 673-675 |
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| Authors: | K Cai |
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| Affiliation: | Qi Shuyan Locomotive and Rolling-Stock Technological Institute, Ministry of Railways, Changzhou 213001, China. |
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| Abstract: | The present paper describes application softwares on file management system,multicomponent linear regression,rapid semiquantitative analysis,analysis of coating thickness and multifunctional Lucas-tooth intensity correction,developed in EDXRF.Utilization of these software improves the analytical quality,management efficiency and development ability of scientific research. |
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| Keywords: | EDXRF Multicomponent Linear regression Intensity correction Analysis of coating thickness |
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