Local structural,magnetic, and optical properties of Zn1−xFexO thin films |
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| Authors: | S-Y Seo C-H Kwak S-H Kim B-H Kim C-I Park S-H Park S-W Han |
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| Institution: | 1. Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea;2. Department of Physics and Institute of Fusion Sciences, Chonbuk National University, Jeonju 561-756, Republic of Korea;3. New Materials & Components Research Center, Research Institute of Industrial Science & Technology, Pohang 790-600, Republic of Korea;4. Division of Science Education, Institute of Fusion Sciences and Institute of Science Education, Chonbuk National University, Jeonju 561-756, Republic of Korea |
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| Abstract: | High quality Zn1−xFexO thin films were deposited on α-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2+ and 3+ states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1−xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films. |
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| Keywords: | A1 Structure A3 Film A3 Sputtering |
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