首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes
Authors:Keyang Xu  Andrew Proctor  David M Hercules
Institution:(1) Department of Chemistry, University of Pittsburgh, 15260 Pittsburgh, PA, USA;(2) Department of Chemistry, Vanderbilt University, 37235 Nashville, TN, USA
Abstract:Polyisoprenes (PIPs) with average molecular weights from 650 to 800,000 Da have been studied by time-of-flight secondary ion mass Spectrometry (TOF-SIMS) in the static mode. Polymer samples were bombarded by argon primary ions, and positive SIMS spectra were collected. Effects of branching and unsaturation in the polymer structure on ion formation were studied. The pendant methyl group showed little tendency to fracture as a cation. In the low mass region, CnH 2n–1 + appeared to be more intense than CnH 2n+1 + , attributed to the double bond structure of polyisoprene. Additionally, ion formation varied as a function of polymer molecular weight. Cationized intact oligomers and fragments dominate the high mass region. Oligomer distributions were used to calculate average molecular weights for polyisoprenes. A statistical chain scission mechanism was used to qualitatively explain the formation of five clusters within a unique fragmentation pattern. Detailed studies of the cluster structure pointed out that each cluster contained several species having varied degrees of unsaturation. It is believed that double bond rearrangements occur.
Keywords:polyisoprenes  polymer structure  polymer molecular weight  fragmentation  SIMS
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号