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基于NIOS边界扫描测试平台的开发
引用本文:杨春玲, 彭立章,.基于NIOS边界扫描测试平台的开发[J].电子器件,2007,30(6):2129-2132.
作者姓名:杨春玲  彭立章  
作者单位:哈尔滨工业大学电气工程学院,哈尔滨,150001
基金项目:黑龙江省自然科学基金 , 黑龙江省哈尔滨市学科后备带头人基金
摘    要:阐述一种新颖的基于NIOS边界扫描测试平台的设计,提出了采用SOPC技术的一种更加灵活、高效的嵌入式系统新解决方案.该方案将边界扫描主控器系统的多功能模块集成在Altera公司推出的低成本、高密度、具有嵌入式NIOS软核CPU的现场可编程门阵列(FPGA)上,大大提高了系统设计的灵活性、边界扫描的测试效率.同时USB接口技术的应用使得边界扫描测试系统具有热插拔,传输速率快等优点.详细论述了具有自主知识产权的JTAG总线控制模块的设计和NIOS平台上USB固件开发.实验结果表明,此测试平台的设计正确有效,能够进行精确的故障诊断.

关 键 词:边界扫描测试  NIOS  USB  嵌入式
文章编号:1005-9490(2007)06-2129-04
修稿时间:2007年1月9日

Development of Boundary Scan Test Platform Based on Nios
YANG Chun-ling,PENG Li-zhang.Development of Boundary Scan Test Platform Based on Nios[J].Journal of Electron Devices,2007,30(6):2129-2132.
Authors:YANG Chun-ling  PENG Li-zhang
Institution:Department of Electrical engineering; Harbin Institute of Technology; Harbin 150001
Abstract:The paper describes an original design of Boundary Scan Test System based on NIOS and brings up a more flexible and effective embedded system solution, which makes use of SOPC technology. This scheme integrates multiple function modules on a low cost and high density FPGA, which is developed with embedded NIOS CPU by Altera corporation. It improves the flexibility of design, testing efficiency of boundary scan system and speed rate of fetching data. At the same time, the application of USB interface technology make the boundary scan test system have these advantages, hot-plug and fast rate of transmission. The design of JTAG bus controlling module and the development of USB firmware on NIOS system is presented.The experimental result has proved the design correct and effective, which is capable of processing fault diagnosis accurately.
Keywords:boundary-scan test  NIOS  USB  Embedded
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