Decoding ‘Maximum Entropy’ Deconvolution |
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| Authors: | Long V. Le Tae Jung Kim Young Dong Kim David E. Aspnes |
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| Affiliation: | 1.Institute of Materials Science, Vietnam Academy of Science and Technology, Hanoi 100000, Vietnam;2.Department of Physics, Kyung Hee University, Seoul 02447, Korea;3.Department of Physics, North Carolina State University, Raleigh, NC 27695-8202, USA |
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| Abstract: | For over five decades, the mathematical procedure termed “maximum entropy” (M-E) has been used to deconvolve structure in spectra, optical and otherwise, although quantitative measures of performance remain unknown. Here, we examine this procedure analytically for the lowest two orders for a Lorentzian feature, obtaining expressions for the amount of sharpening and identifying how spurious structures appear. Illustrative examples are provided. These results enhance the utility of this widely used deconvolution approach to spectral analysis. |
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| Keywords: | maximum entropy deconvolution spectral analysis |
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