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n(Zn):n(Ga)比值对合成ZnGa2O4结构及光致发光性能的影响
引用本文:李春潮,张学英,吴钢,管督.n(Zn):n(Ga)比值对合成ZnGa2O4结构及光致发光性能的影响[J].发光学报,2006,27(6):963-966.
作者姓名:李春潮  张学英  吴钢  管督
作者单位:中国铝业河南分公司研究所, 河南, 郑州, 450041
摘    要:以ZnO和HGaO2为原料,用不同配比合成出系列ZnGa2O4,并对其晶体结构和发光性能进行了研究。用荧光分光光度计检测了ZnGa2O4的激发和发射光谱,用X射线衍射仪检测了ZnGa2O4的衍射图谱,用热重差热仪绘制了TGA-DAT曲线。对检测结果分析认为:1.ZnGa2O4属于尖晶石结构,稍过量的Zn或Ga能进入ZnGa2O4结构中,并对ZnGa2O4的晶格常数产生一定影响。2.ZnGa2O4存在两个自激发光中心,当Ga稍过量时,自激发光中心是四面体镓氧键Td(Ga-O)],最大激发波长约248nm,最大发射波长约367nm;当Zn稍过量时,自激发光中心是八面体镓氧键Oh(Ga-O)],最大激发波长约270nm,最大发射波长约441nm。当n(Zn):n(Ga)在理论值附近,激发和发射光强度最大,而且光谱峰位发生了红移。3.ZnGa2O4的热稳定性能非常好。上述结论对研究ZnGa2O4基质或掺杂的发光材料具有一定意义。

关 键 词:ZnGa2O4  n(Zn):n(Ga)  晶体结构  光致发光
文章编号:1000-7032(2006)06-0963-04
收稿时间:2006-04-06
修稿时间:2006-04-062006-05-15

Influence of the Ratio of n(Zn)∶n(Ga) on the Structure and the Photoluminescence Properties of ZnGa2O4
LI Chun-chao,ZHANG Xue-ying,WU Gang,GUAN Du.Influence of the Ratio of n(Zn)∶n(Ga) on the Structure and the Photoluminescence Properties of ZnGa2O4[J].Chinese Journal of Luminescence,2006,27(6):963-966.
Authors:LI Chun-chao  ZHANG Xue-ying  WU Gang  GUAN Du
Institution:Henan Branch Research Institute CHALCO, Zhengzhou 450041, China
Abstract:Recently, zinc gallate (ZnGa2O4) phosphors have gained much attentions for use in vacuum fluorescent displays (VFD), thin film electroluminescent devices (TFED), field emission displays (FED) and low-voltage cathodeluminescence (LVC), because they exhibit higher chemical stability than sulfide phosphors. ZnGa2O4 is also expected as a new photoluminescence material. The influence of the ratio of n(Zn):n(Ga) on the structure and the photoluminescence properties of ZnGa2O4 was investigated mainly. Using our rich compounds of gallium, ZnGa2O4 with the nominal formula with ZnO/HGaO2 (n(Zn):n(Ga)) ratio ranging from 0.350 to 0.650 was prepared by high temperature solid-state reaction methods. ZnO-HGaO2 system compounds near the ZnGa2O4 stoichiometric composition have been tested with diverse characterization techniques. Fluorescence spectrophotometer was used to measure the photoluminescence excitation and emission spectra of ZnGa2O4. X-ray diffraction measurements were performed to investigate the phase states in the ZnGa2O4 phosphors dependent on the mixture molar ratio of ZnO and HGaO2. Thermal analyzer was used for recording TGA-DTA curves of ZnGa2O4. The results show that ZnGa2O4 has a spinel structure, consists of a cubic cell with Fd3m symmetry, which contains a close-packed array of 32 oxygen atoms with cations in tetrahedral and octahedral interstices. The excess Ga or Zn is soluble in ZnGa2O4 and don't affect the spinel lattice of ZnGa2O4. The lattice constants increased along with increasing of n(Zn):n(Ga) ratio. When Zn excess, the formula of ZnGa2O4 changed into Zn(Ga1-xZnx)2O4,this formula leaded to the increase O2- vacancy. When Ga excess, the formula of ZnGa2O4 changed into (Zn1-xGax)Ga2O4,this formula leaded to the increase Zn2+ vacancy. ZnGa2O4 is a new n-semiconductor material, its lattice interval exist the vacancies and ions, belong to structure defect or crystal defect. The luminescence mechanism is similar the luminescence of semiconducter, with an optical band gap of 4.4 eV. ZnGa2O4 is a kind of self-activated luminescence material with two self-activated optical center, e.g. Td(Ga-O)] and Oh(Ga-O)], its excitation and emission spectras are wider. In n(Zn):n(Ga)≤0.500, the absorption band at 248 nm and the fluorescence band at 367 nm originated from self-activation optical centers of the tetrahedral Td(Ga-O)] in the spinel lattice. In n(Zn):n(Ga)≥0.550, the absorption and the fluorescence band at 270 nm and 441 nm originated from self-activation optical centers of the octahedral Oh(Ga-O)] in the spinel lattice. The peak of excitation and emission shifted to longer wavelength when n(Zn):n(Ga) ratio between 0.500 and 0.550. TGA-DTAanalyses showed ZnGa2O4 had excellent chemical stability properties. These results can help improve understanding ZnGa2O4 or doped ZnGa2O4 phosphors for the application research with high brightness.
Keywords:ZnGa2O4
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