Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine |
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Authors: | A S Sukhikh T V Basova S A Gromilov |
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Abstract: | A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed. |
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