| Abstract: | New approaches to the analysis of small-angle X-ray scattering data from nanoscale systems based on the optimization and direct multiple shooting methods are presented. A program is developed, which bears on these new approaches and allows a user to model small-angle X-ray diffraction data, introduce collimation corrections, and analyze dispersions in the samples. The program results for a number of typical nanosized systems (sols, catalysts) are reported and the comparison with currently available programs for small-angle data processing is presented. |
