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Electron light scattering from doped silicon
Authors:I.P. Ipatova  A.V. Subashiev  V.A. Voitenko
Affiliation:Ioffe Physical Technical Institute, Leningrad 194021, USSR
Abstract:The light scattering from homogeneous intervalley fluctuations of free carriers density in n-Si is calculated for any degree of the electron gas degeneration. Effects of the external stress on the scattering spectrum are considered. Results allow to explain the basic qualitative results of the experiment [7].
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