Optical properties of thin films of system (As2Se3)80−x(As2Te3)x(SnTe)20 prepared by PLD |
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| Authors: | V Parchanski B Frumarov M Frumar M Hrdli
ka M Pavli&#x;ta Mil Vl
ek |
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| Institution: | aDepartment of General and Inorganic Chemistry, Faculty of Chemical Technology, University of Pardubice, Czech Republic;bJoint Laboratory of Solid State Chemistry of Institute of Macromolecular Chemistry of Czech Academy of Sciences, v.v.i. and University of Pardubice, Czech Republic;cResearch Centre LC523, University of Pardubice and Institute of Inorganic Chemistry of Czech Academy of Sciences v.v.i., Czech Republic |
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| Abstract: | Thin amorphous films from system (As2Se3)80−x(As2Te3)x(SnTe)20 were prepared by pulsed laser deposition (PLD) from their bulk glasses and their optical properties were studied by spectral ellipsometry. Spectral dependencies of refractive index, absorption and extinction coefficient and optical gap (1.41–1.66 eV for (As2Se3)80−x(As2Te3)x(SnTe)20 with x = 20 resp. x = 0) were calculated from optical tansmittance, from ellipsometric data by Tauc method. High values of refractive index n0 (2.49–2.60) and of non-linear χ(3) coefficient of index of refraction (4.9–7.5 × 10−12 esu for the glass (As2Se3)80−x(As2Te3)x(SnTe)20 with x = 0 resp. x = 20) made studied thin films of system (As2Se3)80−x(As2Te3)x(SnTe)20 promising candidates for application in optics and optoelectronics. |
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| Keywords: | Ellipsometry Laser deposition Non-linear optics Optical spectroscopy |
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