Visualization of Isofrequency Contours of Strongly Localized Waveguide Modes in Planar Dielectric Structures |
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Authors: | D. V. Permyakov I. S. Sinev S. K. Sychev A. S. Gudovskikh A. A. Bogdanov A. V. Lavrinenko A. K. Samusev |
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Affiliation: | 1.ITMO University,St. Petersburg,Russia;2.St. Petersburg Academic University,St. Petersburg,Russia;3.DTU Fotonik,Technical University of Denmark,Kongens Lyngby,Denmark |
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Abstract: | An experimental method has been proposed to study the dispersion properties of optical surface and waveguide modes in planar structures. An experimental setup involves a microscope with a high numerical aperture objective and a hemispherical solid immersion lens made of zinc selenide in contact with the sample surface. The reflection from the sample is detected in the back focal plane of the system. Such a configuration makes it possible to study strongly localized states with an effective refractive index up to 2.25 in the visible and near infrared spectral ranges. For a thin silicon layer deposited on a glass substrate, the possibility of visualization of isofrequency contrours with polarization resolution and the reconstruction of dispersion of waveguide modes depending on the direction of their propagation has been demonstrated. |
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