Morphology determination of small particles by electron microscopy and electrical conduction measurements |
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| Authors: | B. Robrieux G. Desrousseaux A. Renou M. Gillet |
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| Affiliation: | 1. Laboratoire de Microscopie et de Diffractions Electroniques, U.A. 797 Faculté des Sciences et Techniques de Saint-Jér?me, F-13397, Marseille Cedex 13, France
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| Abstract: | In this paper, we show that it is possible to deduce the actual morphology of small particle condensed onto an insulator by combining the granularity analysis from electron micrographs and the electrical sheet conductance of the deposit on its substrate. Assuming the particles are truncated ellipsoids, we determine the excentricity and the contact angle with the substrate for Au on amorphous carbon and MgO substrates. |
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