| 光学颗粒计数测量技术的理论模型 |
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| 引用本文： | 王建华,殷宗敏,李荣玉.光学颗粒计数测量技术的理论模型[J].四川激光,1999,20(6):47-50. |
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| 作者姓名： | 王建华 殷宗敏 李荣玉 |
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| 作者单位： | 上海交通大学!上海200030 |
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| 摘 要： | 光学颗粒计数测量技术，以激光器作光源利用高灵敏度光电探测器件逐个测量被测颗粒的散射光，从而获得微米级颗粒的尺寸和数量参数。该技术对微电子、医药、机械工程、石没等许多工业领域具有重要意义。本文拟对该技术所需的理论基础，从物理和数学的角度较全面地加以阐述，从而建立超一套实用化的理论模型。
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| 关 键 词： | 光学 颗粒计数 理论模型 |
Theoretical model of optical particle counting measuring technology |
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| Wang Jianhua,Yin Zongmin,Li Rongyu.Theoretical model of optical particle counting measuring technology[J].Laser Journal,1999,20(6):47-50. |
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| Authors: | Wang Jianhua Yin Zongmin Li Rongyu |
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| Abstract: | Optical particle counting measuring technology uses most sensitive diodes as detectorst to measure the scattering light from the single particles so that to measure the quantity and the size of the particles.This technology plays an important role in microelectronics,pharmaceutics,machinery,petroleum,etc.This paper will concentrate to discuss the basic theory which support the technology from the points of physics and mathematics so that to set up a series useful theoretical model. |
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| Keywords: | optics particle counting theoretical model |
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