| DC/DC辐照损伤与VDMOS器件1/f噪声相关性研究 |
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| 引用本文： | 王党会,许天旱,王党朝,曹衎.DC/DC辐照损伤与VDMOS器件1/f噪声相关性研究[J].半导体技术,2008,33(12). |
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| 作者姓名： | 王党会 许天旱 王党朝 曹衎 |
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| 作者单位： | 西安石油大学,材料科学与工程学院,西安,710065;咸阳师范学院,物理系,陕西,咸阳,712000;天津进出口检验检疫局,天津,300456 |
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| 基金项目： | 总装国防预研项目
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| 摘 要： | 通过对DC/DC转换器低频噪声测试技术以及在γ辐照前后电性能与1/f噪声特性变化的对比分析,发现使用低频噪声表征DC/DC转换器的可靠性是对传统电参数表征方法的一种有效补充.对DC/DC转换器辐照损伤与其内部VDMOS器件1/f噪声相关性进行了研究,讨论了引起DC/DC转换器辐照失效的原因.
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| 关 键 词： | DC/DC转换器 1/f噪声 可靠性 相关性 |
Research on the Correlation Between DC/DC Converter Irradiation Damages and VDMOS 1/f Noise |
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| Wang Danghui,Xu Tianhan,Wang Dangchao,Cao Kan.Research on the Correlation Between DC/DC Converter Irradiation Damages and VDMOS 1/f Noise[J].Semiconductor Technology,2008,33(12). |
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| Authors: | Wang Danghui Xu Tianhan Wang Dangchao Cao Kan |
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| Institution: | Wang Danghui1,Xu Tianhan1,Wang Dangchao2,Cao Kan3 (1.School of Materials Science , Engineering,Xi\'an Shiyou University,Xi\'an 710065,China,2.Physics Department,Xianyang Normal University,Xianyang 712000,3.Tianjin Entry-Exit Inspection , Quarantine Bureau,Tianjin 300456,China) |
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| Abstract: | 1/f noise was introduced to figure the reliability of DC/DC,through measuring the 1/f noise of DC/DC converter,the change of some basic electronic parameters and 1/f noise in gamma irradiation were analyzed.It is found that the 1/f noise method becomes a promising tool to evaluate the damage level of DC/DC converter.The irradiation damages between DC/DC converter and its VDMOS were analyzed,and the reasons of DC/DC converter radiation damages were discussed. |
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| Keywords: | DC/DC converter 1/f noise reliability relationship |
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