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Photoemission investigations on nanostructured TiO2 grown by cluster assembling |
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| Authors: | T Caruso C Lenardi T Mazza A Policicchio RG Agostino E Colavita KC Prince P Piseri P Milani |
| Institution: | a CNISM-Dipartimento di Fisica, Università della Calabria, Ponte Bucci, Cubo 33c, I-87036 Arcavacata di Rende (CS), Italy b Istituto di Fisiologia Generale e Chimica Biologica, Via Trentacoste 2, 20133 Milano, Italy c Dipartimento di Fisica, Universita’ di Milano, Via Celoria 16, I-20133 Milano, Italy d Dipartimento di Scienze Chimiche, Università di Padova, Via Marzolo, I-35131 Padova, Italy e Sincrotrone Trieste, Strada Statale 14, km 163.5, in Area Science Park, I-34012 Basovizza (Trieste), Italy f Department of Materials Science and Metallurgy, University of Cambridge, New Museum Site, Cambridge CB2 3QZ, UK g CIMAINA Centro Interdisciplinare Materiali ed Interfacce Nanostrutturati, Universita’ degli Studi di Milano, Italy |
| Abstract: | Nanostructured titanium dioxide (ns-TiO2) films were grown by supersonic cluster beam deposition method. Transmission electron microscopy demonstrated that films are mainly composed by TiO2 nanocrystals embedded in an amorphous TiO2 phase while their electronic structure was studied by photoemission spectroscopy. The cluster assembled ns-TiO2 films are expected to exhibit several structural and chemical defects owing to the large surface to volume ratio of the deposited clusters. Ultraviolet photoemission spectra (hv = 50 eV) from the valence band unveil the presence of a restrained amount of surface Ti 3d defect states in the band gap, whereas Ti 2p core level X-ray photoelectron (hv = 630 eV) spectra do not manifestly disclose these defects. |
| Keywords: | Titanium oxide Photoelectron spectroscopy Transmission electron microscopy Defects Nanostructures |
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