Tl/Ge(1 0 0) system: Phase formation and phase transitions |
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Authors: | A.A. Saranin A.V. Zotov M. Kishida S. Honda K. Oura |
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Affiliation: | a Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia b Faculty of Physics and Engineering, Far Eastern State University, 690000 Vladivostok, Russia c Department of Electronics, Vladivostok State University of Economics and Service, 690600 Vladivostok, Russia d Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan e Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Osaka 567-0047, Japan |
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Abstract: | Using scanning tunneling microscopy, phase formation and temperature-driven phase transitions in Tl/Ge(1 0 0) system have been studied. Evolution of Tl overlayer structure has been considered for three temperature ranges, including around room temperature (RT), high-temperature (HT) (350-450 K) and low-temperature (LT) (20-100 K) ranges. Upon RT growth, a 2 × 1-Tl phase develops in submonolayer range and is completed at around 1 ML of Tl. Cooling of the RT-deposited Tl overlayer results in formation of a set of various LT structures. These are 1D chains, 5 × 4-Tl and “stroked” phases observed in submonolayer range and a long-period c(12 × 14)-Tl phase developed at around 1 ML. All transitions between these RT and LT structures are reversible. At doses beyond 1 ML, RT deposition of Tl onto Ge(1 0 0) leads to the growth of second-layer Tl stripes, forming arrays with a 1 × 4 periodicity. Meanwhile, structure of the first layer also changes and it displays a set of various reconstructions, c(2 × 8), c(10 × 6) and c(10 × 7). All these structures remain unchanged upon cooling to LT. Growth at HT as well as heating of RT-deposited Tl overlayer irreversibly produces 3 × 2-Tl phase whose rows become decorated by second-layer Tl stripes at prolonged Tl deposition. |
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Keywords: | Atom-solid interactions Germanium Thallium Surface structure, morphology, roughness, and topography Scanning tunneling microscopy (STM) |
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