首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Si/SiGe epitaxial-base transistors. I. Materials, physics, andcircuits
Authors:Harame  DL Comfort  JH Cressler  JD Crabbe  EF Sun  JY-C Meyerson  BS Tice  T
Institution:IBM Thomas J. Watson Res. Center, Yorktown Heights, NY;
Abstract:A detailed review of SiGe epitaxial base technology is presented, which chronicles the progression of research from materials deposition through device and integration demonstrations, culminating in the first SiGe integrated circuit application. In part I of this paper, the requirements and processes for high-quality SiGe film preparation are discussed, with emphasis on fundamental principles. A detailed overview of SiGe HBT device design and implications for circuit applications is then presented
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号