Imaging a reflecting plate located in scattering media using optical frequency domain reflectometry |
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| Authors: | Takeaki Yoshimura Naoki Masazumi Yuichi Shigematsu |
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| Institution: | (1) Department of Computer and Systems Engineering, Faculty of Engineering, Kobe University Rokko, 657 Nada, Kobe, Japan |
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| Abstract: | A new imaging system based on optical frequency domain reflectometry is presented. The intensity-integration effect of the
charge coupled device camera to be used acts effectively as a low pass filter for the intensity fluctuation and the 2nd order
moment of the detected signals is proportional to a low beat frequency component of the interference signal. Consequently,
two-dimensionally imaging of the reflectance of a selective plane located in scattering media is demonstrated. |
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| Keywords: | reflectivity imaging scattering medium optical frequency domain reflectometry 2nd order moment |
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