X-ray diffraction study of the bonding between sulphur and the elements of group IVB. The crystal and molecular structures of methylthiotriphenyl-methane, -silicon, -germanium, -tin and -lead |
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Authors: | GD Andreetti G Bocelli G Calestani P Sgarabotto |
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Institution: | Istituto di Strutturistica Chimica, Università degli Studi di Parma, Centra di Studio per la Strutturistica Diffrattometrica del C.N.R., Via M. D''AzegUo 85, 43100 Parma Italy |
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Abstract: | The X-ray analyses of the compounds methylthiotriphenyl-methane, -silicon, -germanium, -tin, and -lead were undertaken to see if the electronic interactions which affect the X-S bond could influence the molecular geometries. The five structures were solved or by direct methods or by Patterson and Fourier techniques and refined anisotropically to R = 0.053, 0.036, 0.031, 0.041, and 0.070 respectively. The central atom exhibits a distorted tetrahedral coordination; only the propeller shape orientation of the phenyl rings seems to be determined by differences in the electronic nature of the central atoms as well as by steric effects. |
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Keywords: | Author to whom all correspondence should be addressed |
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