Fast,high resolution mass spectrometry imaging using a medipix pixelated detector |
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Authors: | Julia H Jungmann Luke MacAleese Ronald Buijs Frans Giskes Ad de Snaijer Jan Visser Jan Visschers Marc J J Vrakking Ron M A Heeren |
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Institution: | 1.FOM Institute for Atomic and Molecular Physics (AMOLF),Amsterdam,The Netherlands;2.Max-Born-Institut,Berlin,Germany;3.National Institute for Subatomic Physics (Nikhef),Amsterdam,The Netherlands |
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Abstract: | In mass spectrometry imaging, spatial resolution is pushed to its limits with the use of ion microscope mass spectrometric
imaging systems. An ion microscope magnifies and then projects the original spatial distribution of ions from a sample surface
onto a position-sensitive detector, while retaining time-of-flight mass separation capabilities. Here, a new type of position-sensitive
detector based on a chevron microchannel plate stack in combination with a 512 × 512 complementary metal-oxide-semiconductor
based pixel detector is coupled to an ion microscope. Spatial resolving power better than 6 μm is demonstrated by secondary
ion mass spectrometry and 8–10μm spatial resolving power is achieved with laser desorption ionization. A detailed evaluation
of key performance criteria such as spatial resolution, acquisition speed, and data handling is presented. |
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