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Chemical Infiltration during Atomic Layer Deposition: Metalation of Porphyrins as Model Substrates
Authors:Lianbing Zhang  Avinash J. Patil Dr.  Le Li  Angelika Schierhorn Dr.  Stephen Mann Prof.  Ulrich Gösele Prof.  Mato Knez Dr.
Affiliation:1. Max‐Planck‐Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle/Saale (Germany), Fax: (+49)?345‐551‐1223;2. Centre for Organized Matter Chemistry, School of Chemistry, University of Bristol (UK);3. Institut für Planzenphysiologie, Martin‐Luther‐Universit?t, Halle (Germany);4. Institut für Biochemie und Biotechnologie, Martin‐Luther‐Universit?t, Halle (Germany)
Abstract:New uses for ALD : By applying standard metal oxide atomic layer deposition (ALD) to two types of porphyrins, site‐specific chemical infiltration of substrate molecules is achieved: Diethylzinc can diffuse into the interior of porphyrin supramolecular structures and induce metalation of the porphyrin molecules from the vapor phase. A=Ph, p‐HO3SC6H4.
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Keywords:atomic layer deposition  metalation  porphyrinoids  vapor‐phase infiltration  zinc
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