Measurement of proton-induced prompt low energy photons by high resolution spectrometry: The analysis of noble metals |
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| Authors: | L. G. Lackay D. Gihwala M. Peisach |
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| Affiliation: | (1) Peninsula Technikon, School of Science, P.O. Box 1906, 7535 Bellville, (South Africa);(2) National Accelerator Centre, P.O. Box 72, 7131 Faure, (South Africa) |
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| Abstract: | Using HPGe detectors, the K X-rays and prompt gamma-rays below 200 keV from Ru, Rh, Pd, Ag, Re, Os, Ir, Pt and Au were measured under bombardment with protons from 1.8 to 5.4 MeV. Excitation functions for analytically important gamma-rays were determined. Interference-free sensitivities were calculated and the method was tested by the analysis of standard dental alloys. |
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