Non-scanning,non-interferometric,three-dimensional optical profilometer with nanometer resolution |
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Authors: | Chen-Tai Tan Yuan-Sheng Chan Jhao-An Chen Teh-Chao Liao Ming-Hung Chiu |
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Affiliation: | Chen-Tai Tan,Yuan-Sheng Chan,Jhao-An Chen,Teh-Chao Liao,and Ming-Hung Chiu Department of Electro-Optical Engineering,National Formosa University No.64,Wunhua Road,Huwei,Yunlin 632,China |
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Abstract: | A non-scanning,non-interferometric,three-dimensional(3D) optical profilometer based on geometric optics,critical angle principle,and the use of a charge-coupled device(CCD) camera is presented.The surface profile of the test specimen can be transferred into the reflectance profile.The reflectance profile,obtained from a CCD,is the ratio of the intensity at the critical angle to the intensity obtained at the total internal reflection angle.The optical profilometer provides a sub-micron measuring range with n... |
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